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A simple way to higher speed atomic force microscopy by retrofitting with a novel high-speed flexure-guided scanner

Bernard Ouma Alunda; Yong Joong Lee; Soyeun Park (Japanese Journal of Applied Physics, 2018-05-08)

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- Bernard Ouma Alunda (1)
- Soyeun Park (1)
- Yong Joong Lee (1)
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- 2018 (1)
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