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Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head
Luke, Oduor Otieno
;
Bernard, Ouma Alunda
;
Jaehyun, Kim
;
Yong, Joong Lee
(
Sensors
,
2021
)
Implementation of a Sinusoidal Raster Scan for High-Speed Atomic Force Microscopy
Luke, Oduor Otieno
;
Yong, Joong Lee
;
Bernard, Ouma Alunda
(
Journal of the Korean Physical Society
,
2020
)
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Author
Bernard, Ouma Alunda (2)
Luke, Oduor Otieno (2)
Yong, Joong Lee (2)
Jaehyun, Kim (1)
Subject
atomic force microscopy; high-speed atomic force microscope; high-speed atomic force microscope scan-head (1)
High-speed atomic force microscopy, Sinusoidal raster scan, FPGA (1)
... View More
Date Issued
2020 (1)
2021 (1)
Has File(s)
Yes (2)