Taita Taveta University Repository

Browsing by Author "Bernard, Ouma Alunda"

Browsing by Author "Bernard, Ouma Alunda"

Sort by: Order: Results:

  • Luke, Oduor Otieno; Bernard, Ouma Alunda; Jaehyun, Kim; Yong, Joong Lee (Sensors, 2021)
    A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of ...
  • Luke, Oduor Otieno; Yong, Joong Lee; Bernard, Ouma Alunda (Journal of the Korean Physical Society, 2020)
    To improve the speed of an atomic force microscope (AFM), one must improve the bandwidth of its components, and the lateral XY scanner is no exception. Sinusoidal raster scans provide a simple way of improving lateral ...

Search TTU Repository

Browse

My Account