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Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy
Bernard Ouma Alunda
;
Yong Joong Lee
(
MDPI
,
2020-08-25
)
A simple way to higher speed atomic force microscopy by retrofitting with a novel high-speed flexure-guided scanner
Bernard Ouma Alunda
;
Yong Joong Lee
;
Soyeun Park
(
Japanese Journal of Applied Physics
,
2018-05-08
)
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Author
Bernard Ouma Alunda (2)
Yong Joong Lee (2)
Soyeun Park (1)
Subject
microcantilever; atomic force microscope; ultra-short cantilevers; high-speed atomic force microscope; biosensors (1)
... View More
Date Issued
2018 (1)
2020 (1)
Has File(s)
Yes (2)